Abstract
This work presents the results of studies of the volt-ampere characteristic, resistivity, as well as infra-red spectra and X-ray diffraction patterns of composite resistors (varistors) based on polypropylene and monocrystalline silicon. The effect of the composition of the components of the composite on the voltampere characteristics, the resistivity values, and the nature of the infrared and X-ray spectra was found.
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Souza, F.L., Gomes, J.W., Bueno, P.R. et al., Mater. Chem. Phys., 2003, vol. 80, pp. 512–516.
Hasanli, Sh.M., Samadova, U.F., and Harirchi, F., Int. J. Adv. Res. Phys. Sci., 2015, vol. 2, no. 6, pp. 30–34.
Valeev, Kh.S. and Kvaskov, V.B., Nelineinye metallooksidnye poluprovodniki (Nonlinear Metal Oxide Semiconductors), Moscow: Energoizdat, 1983.
Gasanly, Sh.M., Imanova, A.Ya., and Samedova, U.F., Surf. Eng. Appl. Electrochem., 2010, vol. 46, no. 2, pp. 165–168.
Magerramov, A.M., Mamedova, R.L., Ismailov, I.M., and Bagirbekov, Kh.V., Tech. Phys., 2017, vol. 62, no. 9, pp. 1377–1380.
Serenko, O.A., Lushcheikin, G.A., Getmanova, E.V., Gritsenko, O.T., and Muzafarov, A.M., Tech. Phys., 2011, vol. 56, no. 9, pp. 1283–1286.
Alizade Rasim, A. and Hasanli, Sh.M., J. Adv. Phys., 2014, vol. 3, pp. 80–86.
Kjstic, P., Milosevic, O., and Pistic, M.M., Physica B+C (Amsterdam), 1990, vol. 150, nos. 1–2, pp. 175–178.
Aharoni Shaul, M., J. Appl. Phys., 1972, vol. 43, no. 5, pp. 2463–2465.
Geil, P.H., Polymer Single Crystals, New York: Wiley, 1963.
Dinnebier, R.E. and Billinge, S.J.L., Powder Diffraction: Theory and Practice, Cambridge: Royal Society of Chemistry, 2008.
Woolfson, M. and Fan, H.-F., Physical and Non-Physical Methods of Solving Crystal Structures, Cambridge: Cambridge Univ. Press, 1995.
Gorelik, S.S., Rastorguev, L.N., and Skakov, Yu.A., Rentgenograficheskii i elektronno-opticheskii analiz (X-Ray and Electron-Optical Analysis), Moscow: Mosk. Inst. Stali Splavov, 2003.
Lipatova, Yu.S. and Shilova, V.V., Rentgenograficheskie metody izucheniya polimernykh sistem (X-ray Analysis of Polymer Systems), Kiev: Naukova Dumka, 1982.
Redchuk, A.S., Burya, A.I., and Golovyatinskaya, V.V., Kompoz. Mater., 2011, vol. 5, no. 2, pp. 59–65.
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Hasanli, S.M., Imanova, A.Y. & Samedova, U.F. Electrophysical Characteristics of Composite Nonlinear Resistors Based on Polymer and Silicon. Surf. Engin. Appl.Electrochem. 55, 114–117 (2019). https://doi.org/10.3103/S1068375519010095
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DOI: https://doi.org/10.3103/S1068375519010095