Abstract
Nano transparent conducting titanium-zinc oxide (Ti-ZnO) thin films were prepared on glass substrates by radio frequency (RF) magnetron sputtering technique. The deposited films are characterized by X-ray diffraction (XRD), four-probe meter and UV-visible spectrophotometer. The effects of Ti-doping content on the structural, optical and electrical properties of the films are investigated. The XRD results show that the obtained films are polycrystalline with a hexagonal wurtzite structure and preferentially oriented in the (002) crystallographic direction. The structural and optoelectronic characteristics of the deposited films are subjected to the Ti-doping content. The Ti-ZnO sample fabricated with the Ti-doping content of 3% (weight percentage) possesses the best crystallinity and optoelectronic performance, with the highest degree of preferred (002) orientation of 99.87%, the largest crystallite size of 83.2 nm, the minimum lattice strain of 6.263×10-4, the highest average visible transmittance of 88.8%, the lowest resistivity of 1.18×10-3 Ω·cm and the maximum figure of merit (FOM) of 7.08×103 Ω-1·cm-1. Furthermore, the optical bandgaps of the films are evaluated by extrapolation method and observed to be an increasing tendency with the increase of the Ti-doping content.
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This work has been supported by the National Natural Science Foundation of China (Nos.11504435 and 11504436), and the Natural Science Foundation of Hubei (Nos.2013CFA052, 2014CFA051 and 2015CFB364).
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Lu, Z., Long, L., Zhong, Zy. et al. Fabrication and characterization of transparent conducting titanium-zinc oxide nanostructured thin films. Optoelectron. Lett. 12, 128–131 (2016). https://doi.org/10.1007/s11801-016-5256-6
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DOI: https://doi.org/10.1007/s11801-016-5256-6