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Investigating the influence of RF power on the photo-detection capabilities of SnS thin films fabricated via RF magnetron sputtering

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Abstract

Tin sulfide (SnS) thin films were prepared using radio-frequency (RF) magnetron sputtering at varying RF sputtering power. The influence of RF power on the structural, optical, morphological, and photo-sensing properties of deposited SnS films were analyzed. X-ray diffraction confirmed the formation of polycrystalline SnS films with an orthorhombic crystal structure. The crystallinity in the samples was observed to be improved with increased RF power. A compact and smooth morphology of the fabricated SnS films were observed using Field-emission scanning electron microscopy (FE-SEM). Energy-dispersive spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS) analysis confirmed a stoichiometric elemental chemical composition of the SnS. The optical bandgap decreased from 1.55 to 1.32 eV with increased RF power due to increased film thickness and crystallite size. The SnS-based photodetectors demonstrated stable photoresponse at 150 W RF power, with excellent photoresponsivity, photodetectivity, and rapid rise and decay times.

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Acknowledgements

The authors thank the Principal of the college, the Head, staff, and students of the department of physics, Sangamner College, for their encouragement and support to carry out this work. Yogesh Hase is grateful to the Ministry of New and Renewable Energy (MNRE), Government of India New Delhi, for the National Renewable Energy (NRE) fellowship. Abhijit Landge is grateful to CSIR-UGC, New Delhi, for the Junior Research Fellowship.

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Authors and Affiliations

  1. Department of Physics, Sangamner Nagarpalika Arts, D. J. Malpani Commerce and B. N. Sarda Science College (Autonomous), Sangamner, Maharashtra, India

    Abbas S. Pathan & Sandeep A. Arote

  2. Department of Physics, Savitribai Phule Pune University, Pune, Maharashtra, India

    Yogesh V. Hase & Sandesh R. Jadkar

  3. Department of Physics, Fergusson College (Autonomous), Pune, Maharashtra, India

    Abhijit S. Landge

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  1. Abbas S. Pathan
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Contributions

Abbas S. Pathan: conceptualization, visualization, formal analysis, data curation, investigation, validation, and writing—original draft. Yogesh V. Hase: data curation, visualization, investigation, and formal analysis. Abhijit S. Landge: formal analysis and writing—review & editing. Sandesh R. Jadkar: project administration, investigation, conceptualization, methodology, and writing—review & editing. Sandeep A. Arote: project administration, investigation, conceptualization, methodology, and writing—review & editing.

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Correspondence to Sandesh R. Jadkar or Sandeep A. Arote.

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Pathan, A.S., Hase, Y.V., Landge, A.S. et al. Investigating the influence of RF power on the photo-detection capabilities of SnS thin films fabricated via RF magnetron sputtering. J Mater Sci: Mater Electron 35, 1318 (2024). https://doi.org/10.1007/s10854-024-13095-1

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