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Hardware Design of Electronic Components Remote Test Adapter Based on Information Processing

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2021 International Conference on Big Data Analytics for Cyber-Physical System in Smart City (BDCPS 2021)

Abstract

With the in-depth integration of a new generation of information technology and electronic manufacturing, electronic components are developing in the direction of miniaturization, and the difficulty of quality inspection has greatly increased. Aiming at the shape defects of electronic components, research the remote testing technology of electronic components based on information processing, design the test system adapter system, and realize the automatic detection of electronic components. The purpose of this paper is to study the hardware design of remote test adapters for electronic components based on information processing. This article first expounds the goal of adapter hardware design, explains the structure design of the adapter, related modules, and introduces the tools used in the development process. This article mainly examines the hardware of the power adapter from the test experiments of adapter adaptation function and adapter resistance operation. Experimental results show that the effective rate of the adapter hardware is as high as 99.8%, and has been maintained above 98.6%. Therefore, the adapter hardware in this study is qualified and meets the design standards.

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Correspondence to Xiran Liu .

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Liu, X. (2022). Hardware Design of Electronic Components Remote Test Adapter Based on Information Processing. In: Atiquzzaman, M., Yen, N., Xu, Z. (eds) 2021 International Conference on Big Data Analytics for Cyber-Physical System in Smart City. BDCPS 2021. Lecture Notes on Data Engineering and Communications Technologies, vol 102. Springer, Singapore. https://doi.org/10.1007/978-981-16-7466-2_50

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