Abstract
In spintronics research, high-spatial-resolution, quantitative, (and in some cases) low-temperature observation of magnetic domains together with elements and crystal-direction distribution is important. As per this point of view, spin-polarized scanning electron microscopy is a significantly powerful method. In this section, the principle, apparatus, capabilities and some representative applications of this microscopy method are described.
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Abbreviations
- ASTM:
-
American Society for Testing and Materials
- EBSD:
-
Electron backscattering diffraction
- SAM:
-
Scanning Auger microscopy or scanning Auger microscope
- spin-SEM:
-
spin-polarized scanning microscopy or spin-polarized scanning microscope
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Koike, K. (2015). Magnetic Domain Imaging with Spin-Polarized SEM. In: Xu, Y., Awschalom, D., Nitta, J. (eds) Handbook of Spintronics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-7604-3_34-1
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DOI: https://doi.org/10.1007/978-94-007-7604-3_34-1
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