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Sparse Bayesian Learning for Extreme Learning Machine Auto-encoder

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Proceedings of ELM 2018 (ELM 2018)

Part of the book series: Proceedings in Adaptation, Learning and Optimization ((PALO,volume 11))

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Abstract

Extreme Learning Machine (ELM) is a popular method in machine learning with extremely few parameters, fast learning speed and model efficiency. While a significant drawback is that ELM is restricted by its single-layer structure and prized analytic solution. If simply stacking more layers, analytic solution of ELM will be intractable. Then gradient-based optimization method is preferred and that results into normal neural networks. Recently a multi-layer ELM (ML-ELM) is proposed to learn compact feature with a series of ELM auto-encoders, which attempts to extend ELM to a deeper network without sacrificing elegant solution. Compared with ML-ELM and following hierarchical ELM, we introduce a sparse Bayesian learning method to imply a stronger sparse regularization and prune network structure. Experiments on classification verify the efficiency of our proposed new multi-layer ELM for unsupervised feature learning.

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References

  1. Lowe, D.G.: Distinctive image features from scale-invariant keypoints. Int. J. Comput. Vis. 60(2), 91–110 (2004)

    Article  Google Scholar 

  2. Dalal, N., Triggs, B.: Histograms of oriented gradients for human detection. In: 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005, vol. 1, pp. 886–893, 25 June 2005. IEEE (2005)

    Google Scholar 

  3. Huang, G.B., Zhou, H., Ding, X., Zhang, R.: Extreme learning machine for regression and multiclass classification. IEEE Trans. Syst. Man Cybern. Part B (Cybern.) 42(2), 513–529 (2012)

    Article  Google Scholar 

  4. Kasun, L.L., Zhou, H., Huang, G.B., Vong, C.M.: Representational learning with extreme learning machine for big data. IEEE Intell. Syst. 28(6), 31–34 (2013)

    Google Scholar 

  5. Kasun, L.L., Yang, Y., Huang, G.B., Zhang, Z.: Dimension reduction with extreme learning machine. IEEE Trans. Image Process. 25(8), 3906–3918 (2016)

    Article  MathSciNet  Google Scholar 

  6. Tang, J., Deng, C., Huang, G.B.: Extreme learning machine for multilayer perceptron. IEEE Trans. Neural Netw. Learn. Syst. 27(4), 809–821 (2016)

    Article  MathSciNet  Google Scholar 

  7. Yoo, Y., Oh, S.Y.: Fast training of convolutional neural network classifiers through extreme learning machines. In: 2016 International Joint Conference on Neural Networks (IJCNN), 24 July, pp. 1702–1708. IEEE (2016)

    Google Scholar 

  8. Wang, Y., Xie, Z., Xu, K., Dou, Y., Lei, Y.: An efficient and effective convolutional auto-encoder extreme learning machine network for 3D feature learning. Neurocomputing 22(174), 988–998 (2016)

    Article  Google Scholar 

  9. Hoerl, A.E., Kennard, R.W.: Ridge regression: biased estimation for nonorthogonal problems. Technometrics 12(1), 55–67 (1970)

    Article  Google Scholar 

  10. Huang, G.B.: An insight into extreme learning machines: random neurons, random features and kernels. Cogn. Comput. 6(3), 376–390 (2014)

    Article  Google Scholar 

  11. Low, C.Y., Teoh, A.B.: Stacking-based deep neural network: deep analytic network on convolutional spectral histogram features. In: 2017 IEEE International Conference on Image Processing (ICIP), 17 September 2017, pp. 1592–1596. IEEE (2017)

    Google Scholar 

  12. Soria-Olivas, E., Gomez-Sanchis, J., Martin, J.D., Vila-Frances, J., Martinez, M., Magdalena, J.R., Serrano, A.J.: BELM: Bayesian extreme learning machine. IEEE Trans. Neural Netw. 22(3), 505–509 (2011)

    Article  Google Scholar 

  13. Luo, J., Vong, C.M., Wong, P.K.: Sparse Bayesian extreme learning machine for multi-classification. IEEE Trans. Neural Netw. Learn. Syst. 25(4), 836–843 (2014)

    Article  Google Scholar 

  14. Congdon, P.: Bayesian Statistical Modelling. Wiley, New York (2007)

    MATH  Google Scholar 

  15. Zhang, N., Ding, S., Shi, Z.: Denoising Laplacian multi-layer extreme learning machine. Neurocomputing 1(171), 1066–1074 (2016)

    Google Scholar 

  16. TU Eindhoven, Leiden University. https://www.openml.org/. Accessed 30 Nov 2018

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Correspondence to Guanghao Zhang , Dongshun Cui , Shangbo Mao or Guang-Bin Huang .

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Zhang, G., Cui, D., Mao, S., Huang, GB. (2020). Sparse Bayesian Learning for Extreme Learning Machine Auto-encoder. In: Cao, J., Vong, C., Miche, Y., Lendasse, A. (eds) Proceedings of ELM 2018. ELM 2018. Proceedings in Adaptation, Learning and Optimization, vol 11. Springer, Cham. https://doi.org/10.1007/978-3-030-23307-5_34

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